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1

Diagnosis in submicron integrated circuits by electric force microscopy

C. Böhm, J. Sprengepiel, E. Kubalek

Journal:

Microelectronics Reliability

Année:

1996

Langue:

english

Fichier:

PDF, 456 KB

english, 1996

2

Cross-talk in electric force microscopy testing of parallel sub-micrometer conducting lines

U. Behnke, W. Mertin, E. Kubalek

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 487 KB

english, 2000

3

Voltage contrast measurements on sub-micrometer structures with an electric force microscope based test system

U. Behnke, B. Wand, W. Mertin, E. Kubalek

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 490 KB

english, 1999

4

Circuit internal logic analysis with electric force microscope- (EFM-) testing

J. Bangert, E. Kubalek

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 451 KB

english, 1998

5

A new test method for contactless quantitative current measurement via scanning magneto-resistive probe microscopy

S. Bae, A. Schlensog, W. Mertin, E. Kubalek, M. Maywald

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 462 KB

english, 1998

6

Quantitative high frequency-electric force microscope testing of monolithic microwave integrated circuits at 20 GHz

V. Wittpahl, C. Ney, U. Behnke, W. Mertin, E. Kubalek

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 469 KB

english, 1999

7

Voltage-influence of biased interconnection line on integrated circuit-internal current contrast measurements via magnetic force microscopy

R. Weber, W. Mertin, E. Kubalek

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 450 KB

english, 2000

8

A new bifunctional topography and current probe for scanning force microscope testing of integrated circuits

S. Bae, K. Schiemann, W. Mertin, E. Kubalek, M. Maywald

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 618 KB

english, 1999

9

Calculation of the influence of electric fields on primary and secondary electrons in electron beam testing of submicron structures

M. Schöttler, H.D. Storzer, E. Kubalek

Journal:

Microelectronic Engineering

Année:

1992

Langue:

english

Fichier:

PDF, 494 KB

english, 1992

10

Two-dimensional measurements of microwave voltage- amplitude and phase distributions within a monolithic integrated interdigital capacitor with a high frequency scanning force microscope test system

A. Leyk, E. Kubalek

Journal:

Microelectronic Engineering

Année:

1996

Langue:

english

Fichier:

PDF, 509 KB

english, 1996

11

Pulsed electron beam generation via laser stimulation

Marko Batinić, Dietmar Begert, Erich Kubalek

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Année:

1995

Langue:

english

Fichier:

PDF, 475 KB

english, 1995

12

Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope

C. Hartmann, R. Weber, W. Mertin, E. Kubalek, A.-D. Müller, M. Hietschold

Journal:

Microelectronics Reliability

Année:

2002

Fichier:

PDF, 1.58 MB

2002

13

MMIC in-circuit and in-device testing with an on-wafer high frequency electric force microscope test system

A. Leyk, S. Van Waasen, F.J. Tegude, E. Kubalek

Journal:

Microelectronics Reliability

Année:

1997

Langue:

english

Fichier:

PDF, 361 KB

english, 1997

14

Contactless current and voltage measurements in integrated circuits by using a needle sensor

M. Neinhüs, R. Weber, U. Behnke, W. Merlin, E. Kubalek, R.A. Breil, M. Detje, A. Feltz

Journal:

Microelectronics Reliability

Année:

2002

Fichier:

PDF, 1.30 MB

2002

15

A new technique for contactless current contrast imaging of high frequency signals

F. Seifert, R. Weber, W. Mertin, E. Kubalek

Journal:

Microelectronics Reliability

Année:

2003

Fichier:

PDF, 1.18 MB

2003

16

Absolute quantitative time resolved voltage measurements on 1 μm conducting lines of integrated circuits via electric force microscope-(EFM-) testing

J. Bangert, E. Kubalek

Journal:

Microelectronics Reliability

Année:

1997

Langue:

english

Fichier:

PDF, 295 KB

english, 1997

17

10.1038/45483

Rice, Sarah, Lin, Abel W., Safer, Daniel, Hart, Cynthia L., Naber, Nariman, Carragher, Bridget O., Cain, Shane M., Pechatnikova, Elena, Wilson-Kubalek, Elizabeth M., Whittaker, Michael, Pate, Edward,

Journal:

Année:

1999

Langue:

english

Fichier:

PDF, 428 KB

english, 1999

18

Cadherin 23 and protocadherin 15 interact to form tip-link filaments in sensory hair cells

Kazmierczak, Piotr, Sakaguchi, Hirofumi, Tokita, Joshua, Wilson-Kubalek, Elizabeth M., Milligan, Ronald A., Müller, Ulrich, Kachar, Bechara

Journal:

Année:

2007

Langue:

english

Fichier:

PDF, 2.36 MB

english, 2007

19

Three-dimensional magnetic field measurement of a modified thin-film magnetic head for vertical recording by means of Lorentz-tomography

Steck, M., Schewe, H., Kubalek, E.

Journal:

IEEE Transactions on Magnetics

Année:

1990

Langue:

english

Fichier:

PDF, 302 KB

english, 1990

20

Evaluation of three-dimensional micromagnetic stray fields by means of electron-beam tomography

Elsbrock, J., Schroeder, W., Kubalek, E.

Journal:

IEEE Transactions on Magnetics

Année:

1985

Langue:

english

Fichier:

PDF, 357 KB

english, 1985

21

Three-dimensional structure of yeast RNA polymerase II at 16 Å resolution

Seth A. Darst, Aled M. Edwards, Elizabeth W. Kubalek, Roger D. Kornberg

Journal:

Année:

1991

Langue:

english

Fichier:

PDF, 9.47 MB

english, 1991

22

Multivalent Microtubule Recognition by Tubulin Tyrosine Ligase-like Family Glutamylases

Garnham, Christopher P., Vemu, Annapurna, Wilson-Kubalek, Elizabeth M., Yu, Ian, Szyk, Agnieszka, Lander, Gabriel C., Milligan, Ronald A., Roll-Mecak, Antonina

Journal:

Année:

2015

Langue:

english

Fichier:

PDF, 4.54 MB

english, 2015

23

Radioactivity of cigarettes and the importance of 210Po and thorium isotopes for radiation dose assessment due to smoking

Kubalek, Davor, Serša, Gregor, Štrok, Marko, Benedik, Ljudmila, Jeran, Zvonka

Journal:

Journal of Environmental Radioactivity

Année:

2016

Langue:

english

Fichier:

PDF, 737 KB

english, 2016

24

Interplay between the Kinesin and Tubulin Mechanochemical Cycles Underlies Microtubule Tip Tracking by the Non-motile Ciliary Kinesin Kif7

Jiang, Shuo, Mani, Nandini, Wilson-Kubalek, Elizabeth M., Ku, Pei-I, Milligan, Ronald A., Subramanian, Radhika

Journal:

Developmental Cell

Année:

2019

Fichier:

PDF, 4.80 MB

2019

25

Debtor Path to Bankruptcy: Dependence on the Annual Percentage Rate Charge

Kubálek, Jan, Fišerová, Zuzana, Paseková, Marie

Journal:

International Advances in Economic Research

Année:

2019

Langue:

english

Fichier:

PDF, 128 KB

english, 2019

26

A Novel Method for Time-resolved Characterization of Micromagnetic Stray Fields with Scanning Probe Microscopy

Bangert, J., Kasim, S., Mertin, W., Kubalek, E.

Journal:

Surface and Interface Analysis

Année:

1997

Langue:

english

Fichier:

PDF, 420 KB

english, 1997

27

Digital signal measurements with electric force microscope testing

Bangert, J., Kubalek, E.

Journal:

Surface and Interface Analysis

Année:

1999

Langue:

english

Fichier:

PDF, 503 KB

english, 1999

28

Rotational tomography in cochlear implant patients: a new tool for quality control of the electrode position

Dr A Aschendorff, R Kubalek, A Bink, FE Zanella, A Hochmuth, M Schumacher, T Klenzner, R Laszig

Journal:

Cochlear Implants International

Année:

2004

Langue:

english

Fichier:

PDF, 50 KB

english, 2004

29

Orientation dependent growth and luminescence of selective GaAs-Sn LPE

U. König, U. Langmann, K. Heime, L.J. Balk, E. Kubalek

Journal:

Journal of Crystal Growth

Année:

1976

Langue:

english

Fichier:

PDF, 636 KB

english, 1976

30

Scanning transmission electron microscopy of heterointerfaces grown by metalorganic vapor phase epitaxy (MOVPE)

H. Lakner, B. Bollig, E. Kubalek, M. Heuken, K. Heime, F. Scheffer, F.E.G. Guimar∼aes

Journal:

Journal of Crystal Growth

Année:

1991

Langue:

english

Fichier:

PDF, 384 KB

english, 1991

31

High resolution scanning transmission electron microscopy (STEM) and luminescence characterization of ZnS/ZnSe multi quantum wells (MQWs) grown by MOVPE

B. Bollig, P. Thorhauer, E. Kubalek, J. Söllner, F.E.G. Guimarães, M. Heuken, K. Heime

Journal:

Journal of Crystal Growth

Année:

1992

Langue:

english

Fichier:

PDF, 753 KB

english, 1992

32

InyGa1-yAs⧸GaAs interface smoothing by GaAs monolayers in highly strained graded superlattice channels (0.2 ≤ y ≤ 0.4) for pseudomorphic AlxGa1-xAs⧸InyGa1-yAs HFET

J. Kraus, H. Meschede, Q. Liu, W. Prost, F.J. Tegude, H. Lakner, E. Kubalek

Journal:

Journal of Crystal Growth

Année:

1993

Langue:

english

Fichier:

PDF, 264 KB

english, 1993

33

Irradiation effects on passivated NMOS-transistors caused by electron beam testing

S. Görlich, E. Kubalek

Journal:

Microelectronic Engineering

Année:

1983

Langue:

english

Fichier:

PDF, 653 KB

english, 1983

34

The capacitive coupling error and the capacitive coupling cross talk in electron beam testing of passivated IC and measures for their reduction

Wolfgang Mertin, Klaus Dieter Herrmann, Erich Kubalek, Rainer Lackmann, Gerd Weichert, Günther Zimmer

Journal:

Microelectronic Engineering

Année:

1990

Langue:

english

Fichier:

PDF, 538 KB

english, 1990

35

A 100-femtosecond electron beam blanking system

J. Fehr, W. Reiners, L.J. Balk, E. Kubalek, D. Köther, I. Wolff

Journal:

Microelectronic Engineering

Année:

1990

Langue:

english

Fichier:

PDF, 428 KB

english, 1990

36

Electron beam testability of monolithic microwave integrated circuits (MMIC)

Wolfgang Mertin, Klaus Dieter Herrmann, Erich Kubalek

Journal:

Microelectronic Engineering

Année:

1990

Langue:

english

Fichier:

PDF, 400 KB

english, 1990

37

Electron beam testing of monolithic integrated micro- and millimeterwave circuits

J. Fehr, H. Sinnwell, L.J. Balk, E. Kubalek

Journal:

Microelectronic Engineering

Année:

1992

Langue:

english

Fichier:

PDF, 446 KB

english, 1992

38

Use of polymeric materials for external electro-optic probing

F. Taenzler, E. Kubalek

Journal:

Microelectronic Engineering

Année:

1992

Langue:

english

Fichier:

PDF, 537 KB

english, 1992

39

Experimental characterization of the perturbations of microwave devices by the electro-optic probe tip

F. Taenzler, W. Mertin, G. David, D. Jäger, E. Kubalek

Journal:

Microelectronic Engineering

Année:

1994

Langue:

english

Fichier:

PDF, 606 KB

english, 1994

40

Scanning-force-microscope test system for device internal test with high spatial and temporal resolution

Christoph Böhm, Christoph Roths, Erich Kubalek

Journal:

Microelectronic Engineering

Année:

1994

Langue:

english

Fichier:

PDF, 758 KB

english, 1994

41

Crosstalk effect in electron beam testing: Simulations and measurements

M. Schöttler, C. Traub, E. Kubalek

Journal:

Microelectronic Engineering

Année:

1994

Langue:

english

Fichier:

PDF, 657 KB

english, 1994

42

Two-dimensional field mapping in coplanar MMIC-components using direct electro-optic probing

G. David, S. Redlich, W. Mertin, E. Kubalek, D. Jäger

Journal:

Microelectronic Engineering

Année:

1994

Langue:

english

Fichier:

PDF, 850 KB

english, 1994

43

Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements

W. Mertin, A. Leyk, T. Novak, G. David, D. Jäger, E. Kubalek

Journal:

Microelectronic Engineering

Année:

1994

Langue:

english

Fichier:

PDF, 637 KB

english, 1994

44

Comparison of measurement results obtained by electron beam testing and indirect electro-optic sampling

M. Batinić, B. Weisbrodt, W. Mertin, E. Kubalek

Journal:

Microelectronic Engineering

Année:

1996

Langue:

english

Fichier:

PDF, 396 KB

english, 1996

45

Finite difference simulation of electric force microscope measurements

U. Mueller, S. Hofschen, C. Boehm, J. Sprengepiel, E. Kubalek, A. Beyer

Journal:

Microelectronic Engineering

Année:

1996

Langue:

english

Fichier:

PDF, 395 KB

english, 1996

46

Digital signal measurements on passivated submicron ICs by scanning force microscope-testing

J. Sprengepiel, C. Böhm, E. Kubalek

Journal:

Microelectronic Engineering

Année:

1996

Langue:

english

Fichier:

PDF, 379 KB

english, 1996

47

Improved transfer of two-dimensional crystals from the air/water interface to specimen support grids for high-resolution analysis by electron microscopy

Elizabeth W. Kubalek, Roger D. Kornberg, Seth A. Darst

Journal:

Ultramicroscopy

Année:

1991

Langue:

english

Fichier:

PDF, 1.26 MB

english, 1991

48

ZnS/ZnSe/GaAs heterostructures grown by metal-organic vapour phase epitaxy

M. Heuken, J. Söllner, W. Betterman, K. Heime, B. Bollig, E. Kubalek

Journal:

Materials Science and Engineering: B

Année:

1991

Langue:

english

Fichier:

PDF, 400 KB

english, 1991

49

Electrical characterization of integrated circuits by scanning force microscopy

C. Böhm, C. Roths, U. Müller, A. Beyer, E. Kubalek

Journal:

Materials Science and Engineering: B

Année:

1994

Langue:

english

Fichier:

PDF, 395 KB

english, 1994

50

Study of quaternary GaInAsSb alloy by scanning transmission electron microscopy

Shuwei Li, Kazuto Koike, Folkert Schulze-Kraasch, Erich Kubalek

Journal:

Journal of Crystal Growth

Année:

2001

Langue:

english

Fichier:

PDF, 175 KB

english, 2001